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 Patents Issused in 2003

The following is a list of the patents awarded to SEH during 2003. Each US patent's title will link to a full text of that patent on the United States Patent and Trademark Office web site.

Patent No. Title Issued Inventor(s)
US 6,503,363 System for Reducing Wafer Contamination Using Freshly, Conditioned Alkaline Etching Solution 1/7/2003 Nakano, Sato, West
US 6,506,667 Growth of Epitaxial Semiconductor Material with Improved Crystallographic Properties 1/14/2003 Boydston, Dietze, Kononchuk
US 6,514,337 Method of Growing Large-Diameter Dislocation-Free <110> Crystalline Ingots 2/4/2003 Nettleton, Faulconer, Johnson (Aaron)
JP 2003-505335 Method of Manufacturing Crystal of Silicon Using an Electric Potential 2/12/2003 Uchikawa, Taie, Rudberg, Kirkland, Baba, Sonokawa
US 6,547,646 System and Method for Supplying Slurry to a Semiconductor Processing Machine 4/15/2003 Eastman, Wells, Shepherd
US 6,562,128 In-Situ Post Epitaxial Treatment Process 5/13/2003 Dietze, Kononchuk
US 6,565,651 Optimized Silicon Wafer Strength for Advanced Semiconductor Devices 5/20/2003 Dietze, Hanna (Sean), Radzimski
US 6,565,652 High Resistivity Silicon Wafer and Method of Producing Same Using the Magnetic Field CZ Method 5/20/2003 Kononchuk, Koveshnikov, Radzimski, Weaver
US 6,569,749 Silicon and Oxygen Ion Co-Implanation for Metallic Gettering in Epitaxial Wafers 5/27/03 Wijaranakula, Ravi, Tate
US 6,570,663 Calibration Method and Device for Visual Measuring Systems 5/27/03 Altukoff, Mayer, White (Barton)